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High resolution x-ray characterization of periodically domain-inverted nonlinear optical crystals

Z.W.Hu*
Department of Physics, University of Warwick, Coventry, CV4 7AL, UK
Clarendon Laboratory, University of Oxford, Parks Road, Oxford, OX1 3PU, UK

P.A.Thomas
Department of Physics, University of Warwick, Coventry, CV4 74 UK

J.Webjörn
Optoelectric Research Centre, University of Southampton, UK
*On leave from National Laboratory of Solid State Microstructures, Nanjing University, Nanjing, China

Abstract

A high-resolution triple-axis diffractometer has been used for the structural characterization of periodically domain-inverted nonlinear optical crystals of KTiOPO4 and LNbO3. Striations have been revealed in high strain-sensitivity multiple-crystal topographs of the domain-inverted regions of both these samples and these are dominated by orientation contrast. The combination of high-resolution reciprocal-space mapping and topography has shown that the extended diffraction streak in the q[210] direction for domain-inverted LiNbO3 originates from the "minutely misoriented structure" which is related to the original configuration of dislocations. The reason for the generation of the structural imperfections via the domain-inversion processing is interpreted in terms of the converse piezoelectric effect.


Applied Physics D (1995) Vol.28(4A) pp.A189-A194

doi: 10.1088/0022-3727/28/4A/03

Southampton ePrint id: 78171

 

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Copyright University of Southampton 2006