Erasable diffractive grating couplers in silicon on insulator for wafer scale testing
Erasable diffractive grating couplers in silicon on insulator for wafer scale testing
Unlike electronic integrated circuits, robust systems are not widely available for effectively testing optical integrated circuits at intermediate points on a waveguide, without introducing substantial losses into the devices. This makes quality control difficult, only the output of the entire optical circuit can be observed; providing complete system information, rather than localising a problem. A benefit of the Silicon on Insulator platform is its low cost; however processed silicon quickly becomes expensive. Each processing step costs money, testing is critical to reducing costs and increasing production yield. Here we report a method for more complete testing of optical circuits.
Topley, R.P.
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Martinez-Jimenez, G.
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O'Faolain, L.
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Healy, N.
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Mailis, S.
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Thomson, D.J.
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Gardes, F.Y.
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Peacock, A.C.
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Payne, D.N.R.
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Mashanovich, G.Z.
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Reed, G.T.
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2014
Topley, R.P.
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Martinez-Jimenez, G.
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O'Faolain, L.
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Healy, N.
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Mailis, S.
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Thomson, D.J.
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Gardes, F.Y.
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Peacock, A.C.
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Payne, D.N.R.
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Mashanovich, G.Z.
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Reed, G.T.
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Topley, R.P., Martinez-Jimenez, G., O'Faolain, L., Healy, N., Mailis, S., Thomson, D.J., Gardes, F.Y., Peacock, A.C., Payne, D.N.R., Mashanovich, G.Z. and Reed, G.T.
(2014)
Erasable diffractive grating couplers in silicon on insulator for wafer scale testing.
SPIE Photonics West 2014, , San Francisco, United States.
01 - 06 Feb 2014.
8 pp
.
(doi:10.1117/12.2039179).
Record type:
Conference or Workshop Item
(Paper)
Abstract
Unlike electronic integrated circuits, robust systems are not widely available for effectively testing optical integrated circuits at intermediate points on a waveguide, without introducing substantial losses into the devices. This makes quality control difficult, only the output of the entire optical circuit can be observed; providing complete system information, rather than localising a problem. A benefit of the Silicon on Insulator platform is its low cost; however processed silicon quickly becomes expensive. Each processing step costs money, testing is critical to reducing costs and increasing production yield. Here we report a method for more complete testing of optical circuits.
Text
Erasable diffractive grating couplers in silicon on insulator for wafer scale testing
- Other
More information
Published date: 2014
Additional Information:
8990-7
Venue - Dates:
SPIE Photonics West 2014, , San Francisco, United States, 2014-02-01 - 2014-02-06
Organisations:
Optoelectronics Research Centre
Identifiers
Local EPrints ID: 363115
URI: http://eprints.soton.ac.uk/id/eprint/363115
PURE UUID: 257bae23-0240-43c9-b207-e60ffd488fe0
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Date deposited: 20 Mar 2014 15:31
Last modified: 15 Mar 2024 03:40
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Contributors
Author:
R.P. Topley
Author:
G. Martinez-Jimenez
Author:
L. O'Faolain
Author:
N. Healy
Author:
S. Mailis
Author:
D.N.R. Payne
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