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Polycrystalline silicon optical fibers with atomically smooth surfaces

Noel Healy1, Laura Lagonigro1, Justin R.Sparks2, Stuart Boden3, Pier J.A.Sazio1, John V.Badding2, and Anna C.Peacock1

1. Optoelectronics Research Centre, University of Southampton, UK
2. Department of Chemistry and Materials Research Institute, Pennsylvania State University, University Park, Pennsylvania 16802, USA
3. Electronics and Computer Systems, University of Southampton, UK

Abstract

We investigate the surface roughness of polycrystalline silicon core optical fibers fabricated using a high-pressure chemical deposition technique. By measuring the optical transmission of two fibers with different core sizes, we will show that scattering from the core–cladding interface has a negligible effect on the losses. A Zemetrics ZeScope three-dimensional optical profiler has been used to directly measure the surface of the core material, confirming a roughness of only ±0.1 nm. The ability to fabricate low-loss polysilicon optical fibers with ultrasmooth cores scalable to submicrometer dimensions should establish their use in a range of nonlinear optical applications.


Optics Letters (2011) Vol.36(13) pp.2480-2482

doi: 10.1364/OL.36.002480

Southampton ePrint id: 192525

 

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