90 nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques
90 nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques
The use of short wavelength sources for microscopy increases resolution via the diffraction limit, and allows the variation in optical contrast, such as that between carbon and water in the 2-4nm regime, to facilitate useful imaging. However, high material absorption and consequent low phase shift, at such wavelengths limit the availability of focussing optics. For coherent illumination, the electric field just after an object can be reconstructed from its far field diffraction pattern by the process of Coherent Diffractive Imaging (CDI), which solves the well-known phase retrieval problem by iteratively applying constraints in the object and far field (Fourier) planes. Synchrotron sources have achieved 3nm resolution using this technique [1].
Parsons, Aaron D.
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Chapman, Richard T.
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Mills, Benjamin
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Butcher, Thomas J.
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Frey, Jeremy G.
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Brocklesby, William S.
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Parsons, Aaron D.
4233ec59-883d-433b-ac17-6fd7a3fafa8b
Chapman, Richard T.
8a9fe0e2-c408-4188-bf10-e93bf247205c
Mills, Benjamin
05f1886e-96ef-420f-b856-4115f4ab36d0
Butcher, Thomas J.
77bed03c-ae8f-4e12-8c35-974150a7cc2d
Frey, Jeremy G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Brocklesby, William S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Parsons, Aaron D., Chapman, Richard T., Mills, Benjamin, Butcher, Thomas J., Frey, Jeremy G. and Brocklesby, William S.
(2011)
90 nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques.
European Conference on Lasers and Electro-Optics, , Munich, Germany.
22 - 26 May 2011.
Record type:
Conference or Workshop Item
(Paper)
Abstract
The use of short wavelength sources for microscopy increases resolution via the diffraction limit, and allows the variation in optical contrast, such as that between carbon and water in the 2-4nm regime, to facilitate useful imaging. However, high material absorption and consequent low phase shift, at such wavelengths limit the availability of focussing optics. For coherent illumination, the electric field just after an object can be reconstructed from its far field diffraction pattern by the process of Coherent Diffractive Imaging (CDI), which solves the well-known phase retrieval problem by iteratively applying constraints in the object and far field (Fourier) planes. Synchrotron sources have achieved 3nm resolution using this technique [1].
More information
e-pub ahead of print date: 2011
Additional Information:
CD.P.35
Venue - Dates:
European Conference on Lasers and Electro-Optics, , Munich, Germany, 2011-05-22 - 2011-05-26
Organisations:
Optoelectronics Research Centre, Chemistry, Physics & Astronomy
Identifiers
Local EPrints ID: 341437
URI: http://eprints.soton.ac.uk/id/eprint/341437
PURE UUID: fb11b3ff-d4b0-4b20-babf-7556d2b71c53
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Date deposited: 25 Jul 2012 11:06
Last modified: 15 Mar 2024 03:27
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Contributors
Author:
Aaron D. Parsons
Author:
Richard T. Chapman
Author:
Thomas J. Butcher
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