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Tuning trapped-mode resonances in a planar metamaterial

Tuning trapped-mode resonances in a planar metamaterial
Tuning trapped-mode resonances in a planar metamaterial
We demonstrate tuning of trapped-mode resonances in a symmetric planar metamaterial both experimentally and theoretically. By controlling the excitation of the Fano-type trapped-mode resonance via the angle of incidence, its quality factor is controlled and the resonance is red-shifted by up to 21%.
567-571
Shi, J.H.
96abbff8-79a5-41d1-8856-374b837dd9ce
Plum, E.
50761a26-2982-40df-9153-7aecc4226eb5
Fedotov, V.A.
3725f5cc-2d0b-4e61-95c5-26d187c84f25
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
Shi, J.H.
96abbff8-79a5-41d1-8856-374b837dd9ce
Plum, E.
50761a26-2982-40df-9153-7aecc4226eb5
Fedotov, V.A.
3725f5cc-2d0b-4e61-95c5-26d187c84f25
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6

Shi, J.H., Plum, E., Fedotov, V.A. and Zheludev, N.I. (2011) Tuning trapped-mode resonances in a planar metamaterial. Progress in Electromagnetics Research Symposium (PIERS 2011), , Suzhou, China. 12 - 16 Sep 2011. pp. 567-571 .

Record type: Conference or Workshop Item (Paper)

Abstract

We demonstrate tuning of trapped-mode resonances in a symmetric planar metamaterial both experimentally and theoretically. By controlling the excitation of the Fano-type trapped-mode resonance via the angle of incidence, its quality factor is controlled and the resonance is red-shifted by up to 21%.

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More information

e-pub ahead of print date: 2011
Venue - Dates: Progress in Electromagnetics Research Symposium (PIERS 2011), , Suzhou, China, 2011-09-12 - 2011-09-16
Organisations: Optoelectronics Research Centre
Learn more about Optoelectronics Research Centre research

Identifiers

Local EPrints ID: 341509
URI: http://eprints.soton.ac.uk/id/eprint/341509
PURE UUID: 8446837d-bf4c-486d-92ab-ab5da34dd763
ORCID for E. Plum: ORCID iD orcid.org/0000-0002-1552-1840
ORCID for N.I. Zheludev: ORCID iD orcid.org/0000-0002-1013-6636

Catalogue record

Date deposited: 26 Jul 2012 08:37
Last modified: 08 Jan 2022 03:09

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Contributors

Author: J.H. Shi
Author: E. Plum ORCID iD
Author: V.A. Fedotov
Author: N.I. Zheludev ORCID iD

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