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In situ loss measurement of direct UV written waveguides using integrated Bragg gratings

In situ loss measurement of direct UV written waveguides using integrated Bragg gratings
In situ loss measurement of direct UV written waveguides using integrated Bragg gratings
The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant nondestructive method. The technique uses integrated Bragg grating structures, which are observed from opposing launch directions to obtain information about the optical power at different positions along the length of the waveguide. Critically, the technique is ratiometric and independent of coupling loss and grating variability. This high-precision measurement is suitable for low-loss planar waveguides. From this data, the propagation loss of the UV-written waveguides was observed to be 0.235±0.006dB/cm.
0146-9592
2849-2851
Rogers, H.L.
c6b6aa89-b14c-48b6-92c0-dd5c5bca683c
Ambran, S.
9dab29a4-1179-4e21-acf6-182c12d29998
Holmes, C.
16306bb8-8a46-4fd7-bb19-a146758e5263
Smith, P.G.R.
8979668a-8b7a-4838-9a74-1a7cfc6665f6
Gates, J.C.
b71e31a1-8caa-477e-8556-b64f6cae0dc2
Rogers, H.L.
c6b6aa89-b14c-48b6-92c0-dd5c5bca683c
Ambran, S.
9dab29a4-1179-4e21-acf6-182c12d29998
Holmes, C.
16306bb8-8a46-4fd7-bb19-a146758e5263
Smith, P.G.R.
8979668a-8b7a-4838-9a74-1a7cfc6665f6
Gates, J.C.
b71e31a1-8caa-477e-8556-b64f6cae0dc2

Rogers, H.L., Ambran, S., Holmes, C., Smith, P.G.R. and Gates, J.C. (2010) In situ loss measurement of direct UV written waveguides using integrated Bragg gratings. Optics Letters, 35 (17), 2849-2851. (doi:10.1364/OL.35.002849).

Record type: Article

Abstract

The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant nondestructive method. The technique uses integrated Bragg grating structures, which are observed from opposing launch directions to obtain information about the optical power at different positions along the length of the waveguide. Critically, the technique is ratiometric and independent of coupling loss and grating variability. This high-precision measurement is suitable for low-loss planar waveguides. From this data, the propagation loss of the UV-written waveguides was observed to be 0.235±0.006dB/cm.

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Published date: September 2010
Learn more about Optoelectronics Research Centre research

Identifiers

Local EPrints ID: 177079
URI: http://eprints.soton.ac.uk/id/eprint/177079
DOI: doi:10.1364/OL.35.002849
ISSN: 0146-9592
PURE UUID: b02a89bb-e4fb-4b1b-a5ed-8d87761c016f
ORCID for C. Holmes: ORCID iD orcid.org/0000-0001-9021-3760
ORCID for P.G.R. Smith: ORCID iD orcid.org/0000-0003-0319-718X
ORCID for J.C. Gates: ORCID iD orcid.org/0000-0001-8671-5987

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Date deposited: 15 Mar 2011 11:56
Last modified: 15 Mar 2024 02:49

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Contributors

Author: H.L. Rogers
Author: S. Ambran
Author: C. Holmes ORCID iD
Author: P.G.R. Smith ORCID iD
Author: J.C. Gates ORCID iD

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