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Nanoscale imaging and diffraction with ultrafast XUV radiation

Nanoscale imaging and diffraction with ultrafast XUV radiation
Nanoscale imaging and diffraction with ultrafast XUV radiation
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67

Brocklesby, W.S. (2010) Nanoscale imaging and diffraction with ultrafast XUV radiation. Progress in Electromagnetics Research Symposium (PIERS 2010), Xian, China. 22 - 26 Mar 2010.

Record type: Conference or Workshop Item (Paper)

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More information

Published date: March 2010
Venue - Dates: Progress in Electromagnetics Research Symposium (PIERS 2010), Xian, China, 2010-03-22 - 2010-03-26
Organisations: Optoelectronics Research Centre

Identifiers

Local EPrints ID: 382450
URI: http://eprints.soton.ac.uk/id/eprint/382450
PURE UUID: 5843dab1-a471-4098-a407-7a00a7ab6c2d
ORCID for W.S. Brocklesby: ORCID iD orcid.org/0000-0002-2123-6712

Catalogue record

Date deposited: 06 Oct 2015 15:50
Last modified: 12 Dec 2021 02:40

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