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Wavelength-dependent loss measurements in polysilicon modified optical fibres

L.Lagonigro1, N.V.Healy1, J.R.Sparks2, N.F.Baril2, P.J.A.Sazio1, J.V.Badding2, A.C.Peacock1

1. Optoelectronics Research Centre, University of Southampton, UK
2. Department of Material Science, Pennsylvania State University, 16802 PA, USA


The recent advancements in on-chip silicon photonics has lead to the demonstration of a number of compact optoelectronic devices owing to the unique material properties of the semiconductor. Although to date most of the major advancements have been based on single-crystal silicon waveguides, lately there has been an increased interest in polycrystalline structures for integrated devices as the deposition process is easier, allowing for more design flexibility. As a photonics material, polysilicon offers good optical and electronic properties but it is typically associated with large losses due to scattering off grain boundaries and surface imperfections at the corecladding interface.

CLEO/Europe-EQEC 2009 Munich 14-19 Jun (2009)

Southampton ePrint id: 78961


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Copyright University of Southampton 2006