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In vacuo measurement of the sensitivity limit of planar Bragg sensors

R.M.Parker1,2, J.C.Gates1, N.P.Sessions1, D.O.Kundys1, C.B.E.Gawith1, M.C.Grossel2, P.G.R.Smith1

(1) Optoelectronics Research Centre, (2) School of Chemistry, University of Southampton, UK


We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain.

CLEO/Europe-EQEC 2009 Munich 14-19 Jun (2009)

doi: 10.1109/CLEOE-EQEC.2009.5196282

Southampton ePrint id: 78998


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Copyright University of Southampton 2006