Thick film growth of high optical quality low loss (0.1dB/cm) Nd:Gd3Ga5O12 on Y3Al5O12 by pulsed laser deposition
Thick film growth of high optical quality low loss (0.1dB/cm) Nd:Gd3Ga5O12 on Y3Al5O12 by pulsed laser deposition
Thick film growth of high optical quality Nd:Gd3Ga5O12 (Nd:GGG) on Y3Al5O12 (YAG) is reported, using the pulsed laser deposition (PLD) technique. Nd:GGG films with thickness up to 135 µm have been grown via sequential deposition runs and up to 40 µm in a single deposition. X-ray diffraction analysis shows that epitaxial growth has occurred and also confirms that the thick Nd:GGG films are single crystal. Analysis by Rutherford backscattering spectrometry shows that the stoichiometry of the thick Nd:GGG films is close to that of bulk Nd:GGG. The thick Nd:GGG films have fluorescence and absorption properties similar to that of bulk Nd:GGG, but slightly broadened. The Findlay–Clay technique of loss calculation has yielded a value of 0.1 dB cm-1 as an estimate of the propagation loss of one of the thick Nd:GGG films that we have subsequently used as a laser medium.
361-371
May-Smith, T.C.
47952bbd-ce28-4507-a723-b4d80bf0f809
Grivas, C.
7f564818-0ac0-4127-82a7-22e87ac35f1a
Shepherd, D.P.
9fdd51c4-39d6-41b3-9021-4c033c2f4ead
Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020
Healy, M.J.F.
64cb9264-7eb9-40bf-a9b0-4bd781cd668c
2004
May-Smith, T.C.
47952bbd-ce28-4507-a723-b4d80bf0f809
Grivas, C.
7f564818-0ac0-4127-82a7-22e87ac35f1a
Shepherd, D.P.
9fdd51c4-39d6-41b3-9021-4c033c2f4ead
Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020
Healy, M.J.F.
64cb9264-7eb9-40bf-a9b0-4bd781cd668c
May-Smith, T.C., Grivas, C., Shepherd, D.P., Eason, R.W. and Healy, M.J.F.
(2004)
Thick film growth of high optical quality low loss (0.1dB/cm) Nd:Gd3Ga5O12 on Y3Al5O12 by pulsed laser deposition.
Applied Surface Science, 223 (4), .
(doi:10.1016/j.apsusc.2003.09.039).
Abstract
Thick film growth of high optical quality Nd:Gd3Ga5O12 (Nd:GGG) on Y3Al5O12 (YAG) is reported, using the pulsed laser deposition (PLD) technique. Nd:GGG films with thickness up to 135 µm have been grown via sequential deposition runs and up to 40 µm in a single deposition. X-ray diffraction analysis shows that epitaxial growth has occurred and also confirms that the thick Nd:GGG films are single crystal. Analysis by Rutherford backscattering spectrometry shows that the stoichiometry of the thick Nd:GGG films is close to that of bulk Nd:GGG. The thick Nd:GGG films have fluorescence and absorption properties similar to that of bulk Nd:GGG, but slightly broadened. The Findlay–Clay technique of loss calculation has yielded a value of 0.1 dB cm-1 as an estimate of the propagation loss of one of the thick Nd:GGG films that we have subsequently used as a laser medium.
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Published date: 2004
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Local EPrints ID: 13943
URI: http://eprints.soton.ac.uk/id/eprint/13943
ISSN: 0169-4332
PURE UUID: 4742ebe8-ef13-4ccf-9ee8-cfe721f76e04
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Date deposited: 11 Jan 2005
Last modified: 16 Mar 2024 02:39
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Author:
T.C. May-Smith
Author:
C. Grivas
Author:
D.P. Shepherd
Author:
M.J.F. Healy
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