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Sub-micron filamentary structures formed during light induced frustrated etching of Fe-doped lithium niobate: results and modelling

Sub-micron filamentary structures formed during light induced frustrated etching of Fe-doped lithium niobate: results and modelling
Sub-micron filamentary structures formed during light induced frustrated etching of Fe-doped lithium niobate: results and modelling
Lithium niobate is a versatile optical material with many applications that result from its wide range of electro-optic, nonlinear, photorefractive and piezoelectric properties. The ability to produce complex, yet controllable, aligned structures in lithium niobate without the need for photolithographic patterning, would allow the implementation of a range of applications such as Bragg and relief grating, periodically poled structures, and miniature electro-optic devices.
Scott, J.G.
a5e576f1-39c6-4c3b-a0e2-42e388e9b583
Boyland, A.J.
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Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020
Scott, J.G.
a5e576f1-39c6-4c3b-a0e2-42e388e9b583
Boyland, A.J.
e6e842e6-0fe6-4de2-a9b8-ca44f30ab4d5
Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020

Scott, J.G., Boyland, A.J. and Eason, R.W. (2003) Sub-micron filamentary structures formed during light induced frustrated etching of Fe-doped lithium niobate: results and modelling. Conference on Lasers and Electro-Optics/Europe (CLEO/Europe-EQEC 2003), Munich, Germany. 22 - 27 Jun 2003. 2 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

Lithium niobate is a versatile optical material with many applications that result from its wide range of electro-optic, nonlinear, photorefractive and piezoelectric properties. The ability to produce complex, yet controllable, aligned structures in lithium niobate without the need for photolithographic patterning, would allow the implementation of a range of applications such as Bragg and relief grating, periodically poled structures, and miniature electro-optic devices.

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More information

Published date: 2003
Additional Information: CG2-3-WED
Venue - Dates: Conference on Lasers and Electro-Optics/Europe (CLEO/Europe-EQEC 2003), Munich, Germany, 2003-06-22 - 2003-06-27

Identifiers

Local EPrints ID: 41669
URI: http://eprints.soton.ac.uk/id/eprint/41669
PURE UUID: aec5d87f-18e4-477f-abb3-b60fafdabffb
ORCID for R.W. Eason: ORCID iD orcid.org/0000-0001-9704-2204

Catalogue record

Date deposited: 12 Oct 2006
Last modified: 16 Mar 2024 02:38

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Contributors

Author: J.G. Scott
Author: A.J. Boyland
Author: R.W. Eason ORCID iD

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