Noncollinear Maker's fringe measurements of second-order nonlinear optical layers
Noncollinear Maker's fringe measurements of second-order nonlinear optical layers
A novel technique for characterising thin-film second-order nonlinearities with sub-micron resolution for the film depth is proposed. This method is substantially a variation of the classic one-beam Makers Fringe Technique and uses the second harmonic generated by two noncollinear fundamental beams.
Compared to the one-beam case this configuration reduces the coherence length of the process, thus increasing the resolution for the nonlinear depth measurements. The technique has been implemented on thermally-poled silica samples, revealing the initial growth of the nonlinear region.
1376-1378
Faccio, D.
439c72fc-1a71-41c2-bc41-f610ab3ddfb5
Pruneri, V.
0e97eb94-b682-409f-a107-ae6b84763f02
Kazansky, P.G.
a5d123ec-8ea8-408c-8963-4a6d921fd76c
2000
Faccio, D.
439c72fc-1a71-41c2-bc41-f610ab3ddfb5
Pruneri, V.
0e97eb94-b682-409f-a107-ae6b84763f02
Kazansky, P.G.
a5d123ec-8ea8-408c-8963-4a6d921fd76c
Faccio, D., Pruneri, V. and Kazansky, P.G.
(2000)
Noncollinear Maker's fringe measurements of second-order nonlinear optical layers.
Optics Letters, 25 (18), .
(doi:10.1364/OL.25.001376).
Abstract
A novel technique for characterising thin-film second-order nonlinearities with sub-micron resolution for the film depth is proposed. This method is substantially a variation of the classic one-beam Makers Fringe Technique and uses the second harmonic generated by two noncollinear fundamental beams.
Compared to the one-beam case this configuration reduces the coherence length of the process, thus increasing the resolution for the nonlinear depth measurements. The technique has been implemented on thermally-poled silica samples, revealing the initial growth of the nonlinear region.
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Published date: 2000
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Local EPrints ID: 30232
URI: http://eprints.soton.ac.uk/id/eprint/30232
ISSN: 0146-9592
PURE UUID: 669095c4-8eb2-45ad-bda0-05e17371952c
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Date deposited: 11 May 2006
Last modified: 15 Mar 2024 07:39
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Author:
D. Faccio
Author:
V. Pruneri
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