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Permanent holographic recording in indium oxide thin films using 193nm excimer laser radiation

Permanent holographic recording in indium oxide thin films using 193nm excimer laser radiation
Permanent holographic recording in indium oxide thin films using 193nm excimer laser radiation
Permanent holographic recording in sputtered indium oxide (InOx) thin film is demonstrated, using ultraviolet radiation at 193 nm emitted by an ArF excimer laser. Steady-state refractive index changes of up to 5 x 10-3 are calculated from the measured diffraction efficiency of a HeNe laser probe beam. The recorded gratings exhibit a dynamic behaviour that relaxes to a steady-state value that depends on the oxygen partial pressure used during growth and on the recording beam intensity. The observed behaviour is explained in terms of laser-induced structural changes.
0947-8396
333-336
Pissadakis, S.
a91c54e0-3b8d-479f-b44e-e678bc34a277
Mailis, S.
233e0768-3f8d-430e-8fdf-92e6f4f6a0c4
Reekie, L.
ec314137-6924-44ad-86a4-ff3f9a67c1b5
Wilkinson, J.S.
73483cf3-d9f2-4688-9b09-1c84257884ca
Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020
Vainos, N.A.
e4f22637-2f1c-4dec-af67-d059261dd5b2
Moschovis, K.
8fa6a4a9-0012-4556-b65d-2bf48f8713cd
Kiriakidis, G.
20ecc498-cfab-40d6-b506-10d4dba09422
Pissadakis, S.
a91c54e0-3b8d-479f-b44e-e678bc34a277
Mailis, S.
233e0768-3f8d-430e-8fdf-92e6f4f6a0c4
Reekie, L.
ec314137-6924-44ad-86a4-ff3f9a67c1b5
Wilkinson, J.S.
73483cf3-d9f2-4688-9b09-1c84257884ca
Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020
Vainos, N.A.
e4f22637-2f1c-4dec-af67-d059261dd5b2
Moschovis, K.
8fa6a4a9-0012-4556-b65d-2bf48f8713cd
Kiriakidis, G.
20ecc498-cfab-40d6-b506-10d4dba09422

Pissadakis, S., Mailis, S., Reekie, L., Wilkinson, J.S., Eason, R.W., Vainos, N.A., Moschovis, K. and Kiriakidis, G. (1999) Permanent holographic recording in indium oxide thin films using 193nm excimer laser radiation. Applied Physics A: Materials Science & Processing, 69 (3), 333-336. (doi:10.1007/s003390051009).

Record type: Article

Abstract

Permanent holographic recording in sputtered indium oxide (InOx) thin film is demonstrated, using ultraviolet radiation at 193 nm emitted by an ArF excimer laser. Steady-state refractive index changes of up to 5 x 10-3 are calculated from the measured diffraction efficiency of a HeNe laser probe beam. The recorded gratings exhibit a dynamic behaviour that relaxes to a steady-state value that depends on the oxygen partial pressure used during growth and on the recording beam intensity. The observed behaviour is explained in terms of laser-induced structural changes.

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More information

Published date: 4 August 1999
Learn more about Optoelectronics Research Centre research

Identifiers

Local EPrints ID: 77844
URI: http://eprints.soton.ac.uk/id/eprint/77844
DOI: doi:10.1007/s003390051009
ISSN: 0947-8396
PURE UUID: 5f768ae8-e31e-4e58-ae9a-65aac3d1012b
ORCID for S. Mailis: ORCID iD orcid.org/0000-0001-8100-2670
ORCID for J.S. Wilkinson: ORCID iD orcid.org/0000-0003-4712-1697
ORCID for R.W. Eason: ORCID iD orcid.org/0000-0001-9704-2204

Catalogue record

Date deposited: 11 Mar 2010
Last modified: 14 Mar 2024 02:33

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Contributors

Author: S. Pissadakis
Author: S. Mailis ORCID iD
Author: L. Reekie
Author: J.S. Wilkinson ORCID iD
Author: R.W. Eason ORCID iD
Author: N.A. Vainos
Author: K. Moschovis
Author: G. Kiriakidis

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